In-Situ Analyzer to Monitor Superconductor Tape Texture

This analyzer was made of a compact X-ray source with an advanced collimating X-ray optic for in-situ texture measurement for superconducting tape. Both the X-ray source and the X-ray detector were automatically scanned over a selected angular range while the kilometer long tape was continuously pulled through the measuring point right from the deposition chamber.

This analyzer increased the measurement speed by more than ten times with a 40-Watt X-ray source than a conventional 800-Watt GADDS system. It received a R&D 100 award (R&D 100 Awards Analytical Instruments —— EXCELL: Tabletop X-Ray Diffraction System that Enables X-rays to Continuously Measure End-to-End Long Length Samples).