X-ray diffraction apparatus and technique for measuring grain orientation using X-ray focusing optic

US Patent 8,130,908 (2012) An X-ray diffraction apparatus for measuring crystal orientation of a multiple grain sample. An X-ray excitation path is provided having a focusing optic for collecting x-rays from an x-ray source and redirecting the collected x-rays into an x-ray beam converging on a single grain of the multiple grain sample. At least one point detector and the sample are rotated relative to each other; and a grain orientation is obtained based upon diffraction patterns collected from first and second grain crystal planes within the apparatus.

Posted in X-ray optics technologies and tagged .

Leave a Reply

Your email address will not be published.